doc. no : qw0905-lwk2 043-p rev. : a date : 21 - jan. - 2009 LWK2043-P round type led lamps ligitek electronics co.,ltd. property of ligitek only pb lead-free parts l dcc
directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. part no. LWK2043-P page 1/6 package dimensions ligitek electronics co.,ltd. property of ligitek only 4.0 0.5 typ 25.0min 2.54typ 1.0min 1.5 max 5.2 4.2 3.0 + -
* static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. 5000 1800 typ. electrostatic discharge( * ) esd 500 v 0.28 0.28 y x chromaticity coordinates (typ.) unit ratings wk mw ma 100 120 g a j 50 -20~ +80 ma 30 page 2/6 j typ. min. 30 max. 3.5 4.0 forward voltage @20ma(v) viewing angle 2 c 1/2 (deg) luminous intensity @20ma(mcd) -30~ +100 symbol parameter i fp pd ir topr peak forward current duty 1/10@10khz power dissipation reverse current @5v operating temperature forward current i f color lens water clear white ingan/gan emitted LWK2043-P material part no storage temperature tstg note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. typical electrical & optical characteristics (ta=25 j ) absolute maximum ratings at ta=25 j ligitek electronics co.,ltd. property of ligitek only part no. LWK2043-P
0.400 0.35 0.360 0.35 0.345 0.34 0.385 0.34 0.385 0.34 0.345 0.34 0.330 0.33 0.370 0.33 0.370 0.33 0.330 0.33 0.315 0.32 0.355 0.32 0.355 0.32 0.315 0.32 0.300 0.31 0.340 0.31 0.26 0.265 0.26 0.225 0.27 0.240 0.27 0.280 0.27 0.280 0.27 0.240 0.28 0.255 0.28 0.295 0.28 0.295 0.28 0.255 0.29 0.270 0.29 0.310 0.29 0.310 0.29 0.270 0.30 0.285 0.30 0.325 0.30 0.325 0.30 0.285 0.31 0.300 0.31 0.340 0.265 0.26 0.225 0.26 0.210 0.25 0.250 0.25 0.250 0.25 0.210 0.25 0.195 0.24 0.235 0.24 0.235 0.24 0.195 0.24 0.180 0.23 0.220 0.23 0.220 0.23 0.180 0.23 0.165 0.22 0.205 0.22 0.205 0.22 0.165 0.22 0.150 0.21 0.190 0.21 b5 a5 c4 b4 a4 c3 b3 a3 a2 b2 c2 c1 b1 y x x y ligitek electronics co.,ltd. property of ligitek only page 3/6 bin bin y bin a1 . chromaticity coordinates specifications for bin grading x . cie chromaticity diagram part no. LWK2043-P
fig.5 luminous spectrum(ta=25 j ) typical electro-optical characteristics curve 1.0 3.0 4.0 0 1 intensity wavelength (nm) 0.5 relative intensity@20ma normalize @25 j forward voltage@20ma normalize @25 j 20 ambient temperature( j ) ambient temperature( j ) 0 -20 -40 0.8 0 -40 -20 100 80 60 40 20 0.0 60 100 80 40 fig.4 relative intensity vs. temperature 2.5 1.0 0.9 1.1 1.5 1.0 2.0 fig.3 forward voltage vs. temperature 1.2 3.0 relative intensity normalize @20ma forward current(ma) forward current(ma) forward voltage(v) 2.0 5.0 1 10 0.0 0.5 1.0 1.5 2.0 100 1000 fig.2 relative intensity vs. forward current fig.1 forward current vs. forward voltage 2.5 3.0 1 10 100 1000 wk chip spectral radiance 80 400 500 600 40 20 60 100 700 800 0 page 4/6 ligitek electronics co.,ltd. property of ligitek only part no. LWK2043-P
note: 1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. part no. LWK2043-P 60 seconds max page 5/6 2.wave soldering profile ligitek electronics co.,ltd. property of ligitek only soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) time(sec) 150 260 c , 3sec max. 100 5c/sec max. 50 preheat 2c/sec max. 260x 120x 0x 0 25x temp(c)
ligitek electronics co.,ltd. property of ligitek only description test condition test item the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) operating life test high temperature storage test 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) low temperature storage test this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 reference standard page 6/6 reliability test: the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs high temperature high humidity test thermal shock test solder resistance test 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles this test intended to see soldering well performed or not. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solderability test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202:103b jis c 7021: b-11 part no. LWK2043-P
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