AN79N00 series 3-pin negative output voltage regulator (300ma type) n overview the AN79N00 series is 3-pin fixed negative output volt- age regulators. stabilized fixed output voltage is obtained from unstable dc input voltage without using any exter- nal components. 12 types of output voltage are available ; C4v, C5v, C6v, C7v, C8v, C9v, C10v, C12v, C15v, C18v, C20v and C24v. they can be used widely in power circuits with current capacitance up to 300ma. n features ? no external components ? output voltage : C4v, C5v, C6v, C7v, C8v, C9v, C10v, C12v, C15v, C18v, C20v, C24v ? short-circuit current limiting built-in ? thermal overload protection built-in ? output transistor safe area compensation n block diagram unit:mm 8.0 3.05 3.8 11.5max. 15.0min. 0.75 0.25 0.5 0.1 0.5 0.25 2.3 4.6 1.76 1 : common 2 : input 3 : output jedec : to-126 (ssip003-p-0000e) 1.44 3.5max. 1.94 + 0.5 ?0.1 123 1 3 2 common output input starter voltage reference error amp. + r 1 q 1 pass tr. r sc current limiter thermal protection r 2
v i p d t opr t stg v v w ?c ?c parameter symbol rating unit n absolute maximum ratings (ta=25?c) ?5 * 1 ?0 * 2 8 * 3 ?0 to +80 ?5 to +150 input voltage power dissipation operating ambient temperature storage temperature * 1 an79n04, an79n05, an79n06, an79n07, an79n08, an79n09, an79n10, an79n12, an79n15, an79n18 * 2 an79n20, an79n24 * 3 follow the derating curve, when t j exceeds 150?c, the internal circuit cuts off the output. parameter symbol condition min typ max output voltage v o ?.16 v ? t j =25?c output voltage tolerance v o v v i = 6 to ?5v, i o =5 to 200ma line regulation reg in 40 mv 9 v i =? to ?5v, t j =25?c mv load regulation reg l mv 20 i o =1 to 300ma, t j =25?c mv i o =5 to 200ma, t j =25?c v i =? to ?7v, t j =25?c ma 3 t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c 4 bias current i bias ma v i =? to ?5v, t j =25?c input bias current fluctuation d i bias (in) ma load bias current fluctuation d i bias (l) v 100 i o =5 to 200ma, t j =25?c output noise voltage v no db f=10hz to 100khz 0.5 0.1 20 ?.2 80 40 5 60 ?.84 ?.8 ripple rejection ratio rr v i =? to ?7v, i o =50ma, f=120hz v 1.1 i o =200ma, t j =25?c minimum input/output voltage difference v dif (min.) ma 10 output short circuit current i o (short) ma 500 v i =?5v, t j =25?c 10 peak output current i o (peak) t j =25?c mv/?c ?0.4 output voltage temperature coefficient d v o /ta i o =5ma unit n electrical characteristics (ta=25?c) an79n04 (?v type)
t j =25?c v i = 7 to ?5v, i o =5 to 200ma v i =? to ?5v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =? to ?8v, t j =25?c t j =25?c v i =? to ?5v, t j =25?c i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =? to ?8v, i o =50ma, f=120hz i o =200ma, t j =25?c v i =?5v, t j =25?c t j =25?c i o =5ma an79n05 (?v type) parameter symbol condition min typ max output voltage v o ?.2 v ? output voltage tolerance v o v line regulation reg in 50 mv 10 mv load regulation reg l mv 20 mv ma 3 5 bias current i bias ma input bias current fluctuation ma load bias current fluctuation 125 output noise voltage v no db 0.5 0.1 30 ?.25 100 50 5 60 ?.8 ?.75 ripple rejection ratio rr v 1.1 minimum input/output voltage difference ma 10 output short circuit current ma 500 10 peak output current ?0.4 output voltage temperature coefficient unit note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?0v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c d i bias (in) d i bias (l) v v dif (min.) i o (short) i o (peak) mv/?c d v o /ta n electrical characteristics (ta=25?c) t j =25?c v i = 8 to ?5v, i o =5 to 200ma v i =? to ?5v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =? to ?9v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?1v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =? to ?5v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =? to ?9v, i o =50ma, f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma an79n06 (?v type) parameter symbol condition min typ max output voltage v o ?.25 v ? output voltage tolerance v o v line regulation reg in 60 mv 11 mv load regulation reg l mv 20 mv ma 3 6 bias current i bias ma input bias current fluctuation ma load bias current fluctuation 150 output noise voltage v no db 0.5 0.1 40 ?.3 120 60 5 60 ?.75 ?.7 ripple rejection ratio rr v 1.1 minimum input/output voltage difference ma 10 output short circuit current ma 500 10 peak output current ?0.4 output voltage temperature coefficient unit
t j =25?c v i = 9 to ?5v, i o =5 to 200ma v i =? to ?5v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?0 to ?0v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?2v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?0 to ?5v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?0 to ?0v, i o =50ma, f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma n electrical characteristics (ta=25?c) an79n07 (?v type) parameter symbol condition min typ max output voltage v o ?.3 v ? output voltage tolerance v o v line regulation reg in 70 mv 12 mv load regulation reg l mv 20 mv ma 3 7 bias current i bias ma input bias current fluctuation ma load bias current fluctuation 175 output noise voltage v no db 0.5 0.1 35 ?.35 140 70 5 59 ?.7 ?.65 ripple rejection ratio rr v 1.1 minimum input/output voltage difference ma 10 output short circuit current ma 500 10 peak output current ?0.5 output voltage temperature coefficient unit t j =25?c v i = 10.5 to ?5v, i o =5 to 200ma v i =?0.5 to ?5v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?1 to ?1v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?4v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?0.5 to ?5v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?1.5 to ?1.5v, i o =50ma,f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma an79n08 (?v type) parameter symbol condition min typ max v o ?.3 v ? v o v reg in 80 mv 13 mv reg l mv 25 mv ma 3 8 i bias ma ma 200 v no db 0.5 0.1 40 ?.4 160 80 5 59 ?.7 ?.6 rr v 1.1 ma 10 ma 500 10 ?0.6 unit output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient
t j =25?c v i = 11.5 to ?6v, i o =5 to 200ma v i =?1.5 to ?6v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?2 to ?2v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?5v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?1.5 to ?6v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?2 to ?2v, i o =50ma, f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma n electrical characteristics (ta=25?c) an79n09 (?v type) v o ?.35 v ? v o v reg in 80 mv 14 mv reg l mv 25 mv ma 3 9 i bias ma ma 225 v no db 0.5 0.1 50 ?.45 180 90 5 58 ?.65 ?.55 rr v 1.1 ma 10 ma 500 10 ?0.6 parameter symbol condition min typ max unit output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient t j =25?c v i = 12.5 to ?7v, i o =5 to 200ma v i =?2.5 to ?7v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?3 to ?3v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?6v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?2.5 to ?7v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?3 to ?3v, i o =50ma,f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma an79n10 (?0v type) v o ?0.4 v ?0 v o v reg in 80 mv 15 mv reg l mv 25 mv ma 3.0 10 i bias ma ma 250 v no db 0.5 0.1 50 ?0.5 200 100 5 58 ?.6 ?.5 rr v 1.1 ma 10 ma 500 10 ?0.7 parameter symbol condition min typ max unit output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient
t j =25?c v i = 14.5 to ?0v, i o =5 to 200ma v i =?4.5 to ?0v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?5 to ?5v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?9v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?4.5 to ?0v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?5 to ?5v, i o =50ma, f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma n electrical characteristics (ta=25?c) an79n12 (?2v type) v o ?2.5 v ?2 v o v reg in 80 mv 15 mv reg l mv 25 mv ma 3 10 i bias ma ma 300 v no db 0.5 0.1 50 ?2.6 240 120 5 57 ?1.5 ?1.4 rr v 1.1 ma 10 ma 500 10 ?0.8 parameter symbol condition min typ max unit output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient t j =25?c v i = 17.5 to ?0v, i o =5 to 200ma v i =?7.5 to ?0v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?8 to ?8v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?3v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?7.5 to ?0v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?8 to ?8v, i o =50ma, f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma an79n15 (?5v type) v o ?5.6 v ?5 v o v reg in 80 mv 16 mv reg l mv 25 mv ma 3 11 i bias ma ma 375 v no db 0.5 0.1 50 ?5.75 240 120 5 56 ?4.4 ?4.25 rr v 1.1 ma 10 ma 500 10 ?.9 parameter symbol condition min typ max unit output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient
t j =25?c v i = 21 to ?3v, i o =5 to 200ma v i =?1 to ?3v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?1 to ?2v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?7v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?1 to ?3v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?2 to ?2v, i o =50ma, f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma n electrical characteristics (ta=25?c) an79n18 (?8v type) v o ?8.7 v ?8 v o v reg in 80 mv 18 mv reg l mv 30 mv ma 3 13 i bias ma ma 450 v no db 0.5 0.1 50 ?8.9 300 150 5 55 ?7.3 ?7.1 rr v 1.1 ma 10 ma 500 10 ? parameter symbol condition min typ max unit output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient t j =25?c v i = 23 to ?5v, i o =5 to 200ma v i =?3 to ?5v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?4 to ?4v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?9v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?3 to ?5v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?4 to ?4v, i o =50ma, f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma an79n20 (?0v type) v o ?0.8 v ?0 v o v reg in 80 mv 19 mv reg l mv 30 mv ma 3 14 i bias ma ma 500 v no db 0.5 0.1 70 ?1 300 150 5 54 ?9.2 ?9 rr v 1.1 ma 10 ma 500 10 ? parameter symbol condition min typ max unit output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient
n basic regulator circuit n application circuit t j =25?c v i = 27 to ?8v, i o =5 to 200ma v i =?7 to ?8v, t j =25?c i o =1 to 300ma, t j =25?c i o =5 to 200ma, t j =25?c v i =?7 to ?7v, t j =25?c t j =25?c note 1) the specified condition t j =25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) when not specified, v i =?3v, i o =100ma, c i =2 f, c o =1 f and t j =0 to 125?c v i =?7 to ?8v, t j =25?c d i bias (in) d i bias (l) v i o =5 to 200ma, t j =25?c f=10hz to 100khz v i =?8 to ?8v, i o =50ma, f=120hz i o =200ma, t j =25?c v dif (min.) i o (short) v i =?5v, t j =25?c i o (peak) t j =25?c mv/?c d v o /ta i o =5ma n electrical characteristics (ta=25?c) an79n24 (?4v type) v o ?5 v ?4 v o v reg in 80 mv 20 mv reg l mv 30 mv ma 3 15 i bias ma ma 600 v no db 0.5 0.1 70 ?5.2 300 150 5 54 ?3 ?2.8 rr v 1.1 ma 10 ma 500 10 ? parameter symbol condition min typ max unit output voltage output voltage tolerance line regulation load regulation bias current input bias current fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference output short circuit current peak output current output voltage temperature coefficient c i is connected when the input line is long. 2 f c o improves the transient response. 1 f c o ? o c i ? i input output AN79N00 common + + 2 f i q i o AN79N00 r v o ? i |i o | = + i q r v o 1 f + + common input output
n characteristic curve 120 100 80 60 40 20 0 10 100 an79n05 i o =50ma 1k 10k 100k frequency f (hz) ripple rejection ratio rr (db) rr?f 0246810 time t ( s) 10 0 ?0 ?0 20 15 10 5 output voltage fluctuation (mv) input current v i (a) input transient response an79n05 0 1020304050 time t ( s) 1 0 ? ? 0.6 0.3 0 output voltage fluctuation (mv) load current v i (v) load transient response an79n05 10 8 6 4 2 0 0 40 80 120 160 ambient temperature ta (?c) p d ?a 1.4 1.2 1.0 0.8 0.6 0.4 ?0 0 50 100 150 junction temperature t j (?c) minimum input/output voltage difference v dif (min.) (v) v dif (min.) ?t j i o =300ma i o =100ma i o =50ma i o =5ma an79n05 power dissipation p d (w) (1) infinite heat sink (2) 5?c/w heat sink (3) 15?c/w heat sink (4) no heat sink (2) (3) (4) (1)
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