?2004 fairchild semiconductor corporation november 2004 FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 FDD8896 / fdu8896 n-channel powertrench ? mosfet 30v, 94a, 5.7m ? general description this n-channel mosfet has been designed specifically to improve the overall efficiency of dc/dc converters using either synchronous or conventional switching pwm controllers. it has been optimized for low gate charge, low r ds(on) and fast switching speed. applications ? dc/dc converters features r ds(on) = 5.7m ? , v gs = 10v, i d = 35a r ds(on) = 6.8m ? , v gs = 4.5v, i d = 35a high performance trench technology for extremely low r ds(on) low gate charge high power and current handling capability mosfet maximum ratings t c = 25c unless otherwise noted thermal characteristics symbol parameter ratings units v dss drain to source voltage 30 v v gs gate to source voltage 20 v i d drain current 94 a continuous (t c = 25 o c, v gs = 10v) (note 1) continuous (t c = 25 o c, v gs = 4.5v) (note 1) 85 a continuous (t amb = 25 o c, v gs = 10v, with r ja = 52 o c/w) 17 a pulsed figure 4 a e as single pulse avalanche energy (note 2) 168 mj p d power dissipation 80 w derate above 25 o c0.53w/ o c t j , t stg operating and storage temperature -55 to 175 o c r jc thermal resistance junction to case to-252, to-251 1.88 o c/w r ja thermal resistance junction to ambient to-252, to-251 100 o c/w r ja thermal resistance junction to ambient to-252, 1in 2 copper pad area 52 o c/w d g s g ds i-pak (to-251aa) g s d to-252 d-pak (to-252)
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 package marking and ordering information electrical characteristics t c = 25 c unless otherwise noted off characteristics on characteristics dynamic characteristics switching characteristics (v gs = 10v) drain-source diode characteristics notes: 1: package current limitation is 35a. 2: starting t j = 25 c, l = 0.43mh, i as = 28a, v dd = 27v, v gs = 10v. 3: FDD8896_nl / fdu8896_nl is lead free product. FDD8896_nl / fdu8896_nl marking will appear on the reel label. device marking device package reel size tape width quantity FDD8896 FDD8896 to-252aa 13 ? 12mm 2500 units fdu8896 fdu8896 to-251aa tube n/a 75 units FDD8896 FDD8896_nl (note 3) to-252aa 13 ? 12mm 2500 units fdu8896 fdu8896_nl (note 3) to-251aa tube n/a 75 units symbol parameter test conditions min typ max units b vdss drain to source breakdown voltage i d = 250 a, v gs = 0v 30 - - v i dss zero gate voltage drain current v ds = 24v - - 1 a v gs = 0v t c = 150 o c - - 250 i gss gate to source leakage current v gs = 20v - - 100 na v gs(th) gate to source threshold voltage v gs = v ds , i d = 250 a 1.2 - 2.5 v r ds(on) drain to source on resistance i d = 35a, v gs = 10v - 0.0047 0.0057 ? i d = 35a, v gs = 4.5v - 0.0057 0.0068 i d = 35a, v gs = 10v, t j = 175 o c - 0.0075 0.0092 c iss input capacitance v ds = 15v, v gs = 0v, f = 1mhz - 2525 - pf c oss output capacitance - 490 - pf c rss reverse transfer capacitance - 300 - pf r g gate resistance v gs = 0.5v, f = 1mhz - 2.1 - ? q g(tot) total gate charge at 10v v gs = 0v to 10v v dd = 15v i d = 35a i g = 1.0ma -4660nc q g(5) total gate charge at 5v v gs = 0v to 5v - 24 32 nc q g(th) threshold gate charge v gs = 0v to 1v - 2.3 3.0 nc q gs gate to source gate charge - 6.9 - nc q gs2 gate charge threshold to plateau - 4.6 - nc q gd gate to drain ? miller ? charge - 9.8 - nc t on tu r n - o n t i m e v dd = 15v, i d = 35a v gs = 10v, r gs = 6.2 ? - - 171 ns t d(on) turn-on delay time - 9 - ns t r rise time - 106 - ns t d(off) turn-off delay time - 53 - ns t f fall time - 41 - ns t off turn-off time - - 143 ns v sd source to drain diode voltage i sd = 35a - - 1.25 v i sd = 15a - - 1.0 v t rr reverse recovery time i sd = 35a, di sd /dt = 100a/ s- -27ns q rr reverse recovered charge i sd = 35a, di sd /dt = 100a/ s- -12nc
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 typical characteristics t c = 25 c unless otherwise noted figure 1. normalized power dissipation vs case temperature figure 2. maximum continuous drain current vs case temperature figure 3. normalized maximum transient thermal impedance figure 4. peak current capability t c , case temperature ( o c) power dissipation multiplier 0 0 25 50 75 100 175 0.2 0.4 0.6 0.8 1.0 1.2 125 150 0 25 50 75 100 25 50 75 100 125 150 175 i d , drain current (a) t c , case temperature ( o c) current limited by package 0.1 1 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 0.01 2 t, rectangular pulse duration (s) z jc , normalized thermal impedance notes: duty factor: d = t 1 /t 2 peak t j = p dm x z jc x r jc + t c p dm t 1 t 2 0.5 0.2 0.1 0.05 0.01 0.02 duty cycle - descending order single pulse 100 1000 30 i dm , peak current (a) t, pulse width (s) 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 t c = 25 o c i = i 25 175 - t c 150 for temperatures above 25 o c derate peak current as follows: transconductance may limit current in this region v gs = 4.5v
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 figure 5. forward bias safe operating area note: refer to fairchild application notes an7514 and an7515 figure 6. unclamped inductive switching capability figure 7. transfer characteristics figure 8. saturation characteristics figure 9. drain to source on resistance vs gate voltage and drain current figure 10. normalized drain to source on resistance vs junction temperature typical characteristics t c = 25 c unless otherwise noted 0.1 1 10 100 1000 110 60 v ds , drain to source voltage (v) i d , drain current (a) t j = max rated t c = 25 o c single pulse limited by r ds(on) area may be operation in this 10 s 1ms dc 100 s 10ms 1 10 100 0.01 0.1 1 10 100 500 i as , avalanche current (a) t av , time in avalanche (ms) starting t j = 25 o c starting t j = 150 o c t av = (l)(i as )/(1.3*rated bv dss - v dd ) if r = 0 if r 0 t av = (l/r)ln[(i as *r)/(1.3*rated bv dss - v dd ) +1] 0 20 40 60 80 100 1.5 2.0 2.5 3.0 3.5 i d , drain current (a) v gs , gate to source voltage (v) pulse duration = 80 s duty cycle = 0.5% max v dd = 15v t j = 175 o c t j = 25 o c t j = -55 o c 0 20 40 60 80 100 0 0.2 0.4 0.6 0.8 i d , drain current (a) v ds , drain to source voltage (v) pulse duration = 80 s duty cycle = 0.5% max t c = 25 o c v gs = 10v v gs = 4v v gs = 2.5v v gs = 5v v gs = 3v 4 6 8 10 12 14 246810 i d = 1a v gs , gate to source voltage (v) i d = 35a r ds(on) , drain to source on resistance (m ? ) pulse duration = 80 s duty cycle = 0.5% max 0.6 0.8 1.0 1.2 1.4 1.6 -80 -40 0 40 80 120 160 200 normalized drain to source t j , junction temperature ( o c) on resistance v gs = 10v, i d = 35a pulse duration = 80 s duty cycle = 0.5% max
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 figure 11. normalized gate threshold voltage vs junction temperature figure 12. normalized drain to source breakdown voltage vs junction temperature figure 13. capacitance vs drain to source voltage figure 14. gate charge waveforms for constant gate current typical characteristics t c = 25 c unless otherwise noted 0.4 0.6 0.8 1.0 1.2 -80 -40 0 40 80 120 160 200 v gs = v ds , i d = 250 a normalized gate t j , junction temperature ( o c) threshold voltage 0.9 1.0 1.1 1.2 -80 -40 0 40 80 120 160 200 t j , junction temperature ( o c) normalized drain to source i d = 250 a breakdown voltage 100 1000 0.1 1 10 30 5000 c, capacitance (pf) v ds , drain to source voltage (v) v gs = 0v, f = 1mhz c iss = c gs + c gd c oss ? c ds + c gd c rss = c gd 0 2 4 6 8 10 0 1020304050 v gs , gate to source voltage (v) q g , gate charge (nc) v dd = 15v i d = 35a i d = 5a waveforms in descending order:
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 test circuits and waveforms figure 15. unclamped energy test circuit figure 16. unclamped energy waveforms figure 17. gate charge test circuit figure 18. gate charge waveforms figure 19. switching time test circuit figure 20. switching time waveforms t p v gs 0.01 ? l i as + - v ds v dd r g dut vary t p to obtain required peak i as 0v v dd v ds bv dss t p i as t av 0 v gs + - v ds v dd dut i g(ref) l v dd q g(th) v gs = 1v q gs2 q g(tot) v gs = 10v v ds v gs i g(ref) 0 0 q gs q gd q g(5) v gs = 5v v gs r l r gs dut + - v dd v ds v gs t on t d(on) t r 90% 10% v ds 90% 10% t f t d(off) t off 90% 50% 50% 10% pulse width v gs 0 0
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 thermal resistance vs. mounting pad area the maximum rated junction temperature, t jm , and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, p dm , in an application. therefore the application ? s ambient temperature, t a ( o c), and thermal resistance r ja ( o c/w) must be reviewed to ensure that t jm is never exceeded. equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. in using surface mount devices such as the to-252 package, the environment in which it is applied will have a significant influence on the part ? s current and maximum power dissipation ratings. precise determination of p dm is complex and influenced by many factors: 1. mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 2. the number of copper layers and the thickness of the board. 3. the use of external heat sinks. 4. the use of thermal vias. 5. air flow and board orientation. 6. for non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in. fairchild provides thermal information to assist the designer ? s preliminary application evaluation. figure 21 defines the r ja for the device as a function of the top copper (component side) area. this is for a horizontally positioned fr-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. this graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. pulse applications can be evaluated using the fairchild device spice thermal model or manually utilizing the normalized maximum transient thermal impedance curve. thermal resistances corresponding to other copper areas can be obtained from figure 21 or by calculation using equation 2 or 3. equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeters square. the area, in square inches or square centimeters is the top copper area including the gate and source pads. (eq. 1) p dm t jm t a ? () r ja ----------------------------- = area in inches squared (eq. 2) r ja 33.32 23.84 0.268 area + () ------------------------------------ - + = (eq. 3) r ja 33.32 154 1.73 area + () ---------------------------------- + = area in centimeters squared 25 50 75 100 125 0.01 0.1 1 10 figure 21. thermal resistance vs mounting pad area r ja = 33.32+ 23.84/(0.268+area) eq.2 r ja ( o c/w) area, top copper area in 2 (cm 2 ) r ja = 33.32+ 154/(1.73+area) eq.3 (0.645) (6.45) (64.5) (0.0645)
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 pspice electrical model .subckt FDD8896 2 1 3 ; rev july 2003 ca 12 8 2.3e-9 cb 15 14 2.3e-9 cin 6 8 2.3e-9 dbody 7 5 dbodymod dbreak 5 11 dbreakmod dplcap 10 5 dplcapmod ebreak 11 7 17 18 32.6 eds 14 8 5 8 1 egs 13 8 6 8 1 esg 6 10 6 8 1 evthres 6 21 19 8 1 evtemp 20 6 18 22 1 it 8 17 1 lgate 1 9 4.6e-9 ldrain 2 5 1.0e-9 lsource 3 7 1.7e-9 rlgate 1 9 46 rldrain 2 5 10 rlsource 3 7 17 mmed 16 6 8 8 mmedmod mstro 16 6 8 8 mstromod mweak 16 21 8 8 mweakmod rbreak 17 18 rbreakmod 1 rdrain 50 16 rdrainmod 2.2e-3 rgate 9 20 2.1 rslc1 5 51 rslcmod 1e-6 rslc2 5 50 1e3 rsource 8 7 rsourcemod 2e-3 rvthres 22 8 rvthresmod 1 rvtemp 18 19 rvtempmod 1 s1a 6 12 13 8 s1amod s1b 13 12 13 8 s1bmod s2a 6 15 14 13 s2amod s2b 13 15 14 13 s2bmod vbat 22 19 dc 1 eslc 51 50 value={(v(5,51)/abs(v(5,51)))*(pwr(v(5,51)/(1e-6*500),10))} .model dbodymod d (is=5e-12 ikf=10 n=1.01 rs=2.6e-3 trs1=8e-4 trs2=2e-7 + cjo=8.8e-10 m=0.57 tt=1e-16 xti=0.9) .model dbreakmod d (rs=8e-2 trs1=1e-3 trs2=-8.9e-6) .model dplcapmod d (cjo=9.4e-10 is=1e-30 n=10 m=0.4) .model mmedmod nmos (vto=1.85 kp=10 is=1e-30 n=10 tox=1 l=1u w=1u rg=2.1 t_abs=25) .model mstromod nmos (vto=2.34 kp=350 is=1e-30 n=10 tox=1 l=1u w=1u t_abs=25) .model mweakmod nmos (vto=1.55 kp=0.05 is=1e-30 n=10 tox=1 l=1u w=1u rg=21 rs=0.1 t_abs=25) .model rbreakmod res (tc1=8.3e-4 tc2=-4e-7) .model rdrainmod res (tc1=1e-4 tc2=8e-6) .model rslcmod res (tc1=9e-4 tc2=1e-6) .model rsourcemod res (tc1=7.5e-3 tc2=1e-6) .model rvthresmod res (tc1=-1.7e-3 tc2=-8.8e-6) .model rvtempmod res (tc1=-2.6e-3 tc2=2e-7) .model s1amod vswitch (ron=1e-5 roff=0.1 von=-4 voff=-3) .model s1bmod vswitch (ron=1e-5 roff=0.1 von=-3 voff=-4) .model s2amod vswitch (ron=1e-5 roff=0.1 von=-2 voff=-0.5) .model s2bmod vswitch (ron=1e-5 roff=0.1 von=-0.5 voff=-2) .ends note: for further discussion of the pspice model, consult a new pspice sub-circuit for the power mosfet featuring global temperature options ; ieee power electronics specialist conference records, 1991, written by william j. hepp and c. frank wheatley. 18 22 + - 6 8 + - 5 51 + - 19 8 + - 17 18 6 8 + - 5 8 + - rbreak rvtemp vbat rvthres it 17 18 19 22 12 13 15 s1a s1b s2a s2b ca cb egs eds 14 8 13 8 14 13 mweak ebreak dbody rsource source 11 7 3 lsource rlsource cin rdrain evthres 16 21 8 mmed mstro drain 2 ldrain rldrain dbreak dplcap eslc rslc1 10 5 51 50 rslc2 1 gate rgate evtemp 9 esg lgate rlgate 20 + - + - + - 6
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 saber electrical model rev july 2003 template FDD8896 n2,n1,n3 =m_temp electrical n2,n1,n3 number m_temp=25 { var i iscl dp..model dbodymod = (isl=5e-12,ikf=10,nl=1.01,rs=2.6e-3,trs1=8e-4,trs2=2e-7,cjo=8.8e-10,m=0.57,tt=1e-16,xti=0.9) dp..model dbreakmod = (rs=8e-2,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=9.4e-10,isl=10e-30,nl=10,m=0.4) m..model mmedmod = (type=_n,vto=1.85,kp=10,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.34,kp=350,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.55,kp=0.05,is=1e-30, tox=1,rs=0.1) sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-3) sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3,voff=-4) sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-2,voff=-0.5) sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-0.5,voff=-2) c.ca n12 n8 = 2.3e-9 c.cb n15 n14 = 2.3e-9 c.cin n6 n8 = 2.3e-9 dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod spe.ebreak n11 n7 n17 n18 = 32.6 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 i.it n8 n17 = 1 l.lgate n1 n9 = 4.6e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 1.7e-9 res.rlgate n1 n9 = 46 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 17 m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u, temp=m_temp m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u, temp=m_temp m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u, temp=m_temp res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-4e-7 res.rdrain n50 n16 = 2.2e-3, tc1=1e-4,tc2=8e-6 res.rgate n9 n20 = 2.1 res.rslc1 n5 n51 = 1e-6, tc1=9e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 2e-3, tc1=7.5e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-1.7e-3,tc2=-8.8e-6 res.rvtemp n18 n19 = 1, tc1=-2.6e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/500))** 10)) } } 18 22 + - 6 8 + - 19 8 + - 17 18 6 8 + - 5 8 + - rbreak rvtemp vbat rvthres it 17 18 19 22 12 13 15 s1a s1b s2a s2b ca cb egs eds 14 8 13 8 14 13 mweak ebreak dbody rsource source 11 7 3 lsource rlsource cin rdrain evthres 16 21 8 mmed mstro drain 2 ldrain rldrain dbreak dplcap iscl rslc1 10 5 51 50 rslc2 1 gate rgate evtemp 9 esg lgate rlgate 20 + - + - + - 6
?2004 fairchild semiconductor corporation FDD8896 / fdu8896 rev. c1 FDD8896 / fdu8896 pspice thermal model rev 23 july 2003 FDD8896t ctherm1 th 6 9e-4 ctherm2 6 5 1e-3 ctherm3 5 4 2e-3 ctherm4 4 3 3e-3 ctherm5 3 2 7e-3 ctherm6 2 tl 8e-2 rtherm1 th 6 3.0e-2 rtherm2 6 5 1.0e-1 rtherm3 5 4 1.8e-1 rtherm4 4 3 2.8e-1 rtherm5 3 2 4.5e-1 rtherm6 2 tl 4.6e-1 saber thermal model saber thermal model FDD8896t template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =9e-4 ctherm.ctherm2 6 5 =1e-3 ctherm.ctherm3 5 4 =2e-3 ctherm.ctherm4 4 3 =3e-3 ctherm.ctherm5 3 2 =7e-3 ctherm.ctherm6 2 tl =8e-2 rtherm.rtherm1 th 6 =3.0e-2 rtherm.rtherm2 6 5 =1.0e-1 rtherm.rtherm3 5 4 =1.8e-1 rtherm.rtherm4 4 3 =2.8e-1 rtherm.rtherm5 3 2 =4.5e-1 rtherm.rtherm6 2 tl =4.6e-1 } rtherm4 rtherm6 rtherm5 rtherm3 rtherm2 rtherm1 ctherm4 ctherm6 ctherm5 ctherm3 ctherm2 ctherm1 tl 2 3 4 5 6 th junction case
disclaimer fairchild semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function or design. fairchild does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights, nor the rights of others. trademarks the following are registered and unregistered trademarks fairchild semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. life support policy fairchild?s products are not authorized for use as critical components in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used herein: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. a critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms datasheet identification product status definition advance information preliminary no identification needed obsolete this datasheet contains the design specifications for product development. specifications may change in any manner without notice. this datasheet contains preliminary data, and supplementary data will be published at a later date. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains final specifications. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains specifications on a product that has been discontinued by fairchild semiconductor. the datasheet is printed for reference information only. formative or in design first production full production not in production isoplanar? littlefet? microcoupler? microfet? micropak? microwire? msx? msxpro? ocx? ocxpro? optologic ? optoplanar? pacman? pop? fast ? fastr? fps? frfet? globaloptoisolator? gto? hisec? i 2 c? i-lo ? implieddisconnect? rev. i14 acex? activearray? bottomless? coolfet? crossvolt ? dome? ecospark? e 2 cmos? ensigna? fact? fact quiet series? power247? poweredge? powersaver? powertrench ? qfet ? qs? qt optoelectronics? quiet series? rapidconfigure? rapidconnect? serdes? silent switcher ? smart start? spm? stealth? superfet? supersot?-3 supersot?-6 supersot?-8 syncfet? tinylogic ? tinyopto? trutranslation? uhc? ultrafet ? unifet? vcx? across the board. around the world.? the power franchise ? programmable active droop?
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