pb lead-free parts rectangle type led lamps lduv65063/l15 ligitek electronics co.,ltd. property of ligitek only lduv65063/l15 data sheet doc. no : qw0905- rev. : a date : 21 - dec. - 2007
1.5 4.0 0.40typ 1.0max r1.38 0.35typ - + 2.0typ 0.45max 25.0min 1.0min 2.7 1/5 page lduv65063/l15 part no. ligitek electronics co.,ltd. property of ligitek only package dimensions note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation 30 -30 75% 100% 50% -60 25% 25% 0 50% 75%100% 60 0
t opr operating temperature -20 ~ +80 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. typical electrical & optical characteristics (ta=25 ) purple material part no lduv65063/l15 ingan storage temperature spectral halfwidth nm forward voltage @20ma(v) viewing angle 2 1/2 (deg) luminous intensity @20ma(mcd) peak wave length pnm water clear emitted lens 400204.0 max. 3.0 min. 5 min. 110 9 typ. -30 ~ +100 color tstg absolute maximum ratings at ta=25 electrostatic discharge( * ) forward current reverse current @5v peak forward current duty 1/10@10khz power dissipation parameter page 2/5 150 ratings i f esd ir pd i fp symbol ma 30 50 120 100 a v ma mw duv unit ligitek electronics co.,ltd. property of ligitek only static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * lduv65063/l15 part no.
page 3/5 100 r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a 3.4 0.5 f o r w a r d v o l t a g e ( v ) forward current(ma) wavelength (nm) forward current(ma) fig.3 forward current vs. wavelength w a v e l e n g t h ( n m ) w l p 380 2040 390 60 410 400 420 3.1 2040 30 3.2 3.3 60 5070 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a 80100 350 0.0 1.0 450 400 550 fig.4 relative intensity vs. wavelength 8090100 0 30 20 forward current(ma) 70 50 40608090 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve duv chip 3.9 3.6 3.5 3.8 3.7 fig.2 relative intensity vsforward current ligitek electronics co.,ltd. property of ligitek only 1.0 1.5 2.0 2.5 lduv65063/l15 part no.
2.wave soldering profile 120 note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 60 seconds max 2 /sec max 25 0 0 50 preheat 100 time(sec) 150 dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) 260 5 /sec max 260 c3sec max temp( c) soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) ligitek electronics co.,ltd. property of ligitek only page 4/5 lduv65063/l15 part no.
low temperature storage test 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles solder resistance test 1.t.sol=260 5 2.dwell time= 10 1sec. 1.t.sol=230 5 2.dwell time=5 1sec solderability test thermal shock test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs high temperature high humidity test mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 this test intended to see soldering well performed or not. mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hours. mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) test condition high temperature storage test operating life test test item reliability test: the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. mil-std-883:1008 jis c 7021: b-10 this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 reference standard ligitek electronics co.,ltd. property of ligitek only page 5/5 lduv65063/l15 part no.
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