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 PD-97258
POWER MOSFET SURFACE MOUNT (D3 PAK)
Product Summary
Part Number
IRFMJ044
IRFMJ044 60V, N-CHANNEL
HEXFET MOSFET TECHNOLOGY
(R)
RDS(on)
0.04
ID
35A*
HEXFET(R) MOSFET technology is the key to International Rectifier's advanced line of power MOSFET transistors. The efficient geometry design achieves very low on-state resistance combined with high transconductance. HEXFET transistors also feature all of the well-established advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and electrical parameter temperature stability. They are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers, high energy pulse circuits, and virtually any application where high reliability is required. The HEXFET transistor's totally isolated package eliminates the need for additional isolating material between the device and the heatsink. This improves thermal efficiency and reduces drain capacitance.
D3 PAK
Features:
n n n n n n n
Simple Drive Requirements Ease of Paralleling Hermetically Sealed Electrically Isolated Dynamic dv/dt Rating Light-weight Screened to JANTX Level per MIL-PRF-19500
Absolute Maximum Ratings
Parameter
ID @ VGS = 10V, TC = 25C ID @ VGS = 10V, TC = 100C IDM PD @ TC = 25C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current Continuous Drain Current Pulsed Drain Current A Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy A Avalanche Current A Repetitive Avalanche Energy A Peak Diode Recovery dv/dt A Operating Junction Storage Temperature Range Weight 35* 28 140 125 1.0 20 340 35 12.5 4.5 -55 to 150 9.3 (Typical)
Units A
W
W/C
V mJ A mJ V/ns
o
C
g
*Current is limited by package For footnotes refer to the last page
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1
09/13/06
IRFMJ044
Electrical Characteristics @ Tj = 25C (Unless Otherwise Specified)
Parameter
BVDSS Drain-to-Source Breakdown Voltage BV DSS /T J Temperature Coefficient of Breakdown Voltage RDS(on) Static Drain-to-Source On-State Resistance VGS(th) Gate Threshold Voltage g fs Forward Transconductance IDSS Zero Gate Voltage Drain Current
Min
60 -- -- 2.0 17 -- -- -- -- -- -- -- -- -- -- -- -- -- --
Typ Max Units
-- 0.68 -- -- -- -- -- -- -- 0.04 0.05 4.0 -- 25 250 V V/C V S( ) A
Test Conditions
VGS = 0V, ID = 1.0mA Reference to 25C, ID = 1.0mA VGS = 10V, ID = 28A A VGS = 10V, ID = 35A VDS = VGS, ID = 250A VDS > 15V, IDS = 28A A VDS= 48V ,VGS=0V VDS = 48V, VGS = 0V, TJ = 125C VGS = 20V VGS = -20V VGS =10V, ID = 35A VDS = 30V VDD = 30V, ID = 35A, VGS =10V, RG = 9.1
IGSS IGSS Qg Q gs Q gd td(on) tr td(off) tf Ciss C oss C rss
Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (`Miller') Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance
-- 100 -- -100 -- 88 -- 15 -- 52 -- 23 -- 130 -- 81 -- 79 2400 -- 1100 -- 230 --
nA nC
ns
pF
VGS = 0V, VDS = 25V f = 1.0MHz
Source-Drain Diode Ratings and Characteristics
Parameter
IS ISM VSD trr Q RR ton Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) A Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time
Min Typ Max Units
-- -- -- -- -- -- -- -- -- -- 35* 140 2.5 220 1.6
Test Conditions
A
V ns C Tj = 25C, IS = 35A, VGS = 0V A Tj = 25C, IF = 35A, di/dt 100A/s VDD 50V A
Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
*Current is limited by package
Thermal Resistance
Parameter
RthJC RthJCS RthJA Junction-to-Case Case-to-Sink Junction-to-Ambient
Min Typ Max Units
-- -- -- -- 0.21 -- 1.0 -- 48
C/W
Test Conditions
Typical socket mount
For footnotes refer to the last page
2
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IRFMJ044
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance Vs. Temperature
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3
IRFMJ044
13a & b
Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage
Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 8. Maximum Safe Operating Area
4
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IRFMJ044
V DS VGS RG 10V
Pulse Width 1 s Duty Factor 0.1 %
RD
D.U.T.
+
-V DD
Fig 10a. Switching Time Test Circuit
VDS 90%
Fig 9. Maximum Drain Current Vs. Case Temperature
10% VGS
td(on) tr t d(off) tf
Fig 10b. Switching Time Waveforms
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
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IRFMJ044
15V
VDS
L
DRIVER
RG
D.U.T.
IAS tp
+ - VDD
A
1 20V
0.01
Fig 12a. Unclamped Inductive Test Circuit
V(BR)DSS tp
Fig 12c. Maximum Avalanche Energy Vs. Drain Current
I AS
Fig 12b. Unclamped Inductive Waveforms
Current Regulator Same Type as D.U.T.
50K
QG
12V 0
.2F .3F
10 V
QGS VG QGD
VGS
3mA
D.U.T.
+ V - DS
Charge
IG
ID
Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform
Fig 13b. Gate Charge Test Circuit
6
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IRFMJ044
Footnotes:
A Repetitive Rating; Pulse width limited by A ISD 35A, di/dt 100A/s, A Pulse width 300 s; Duty Cycle 2%
VDD 60V, TJ 150C maximum junction temperature. A VDD = 25V, starting TJ = 25C, L= 0.5mH Peak IL = 35A, VGS = 10V
Case Outline and Dimensions -- D3 PAK
PIN AS S IGNMENT S 1 = DRAIN 2 = S OURCE 3 = GAT E
1
2
3
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 IR LEOMINSTER : 205 Crawford St., Leominster, Massachusetts 01453, USA Tel: (978) 534-5776 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 09/2006
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