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| Part No. |
TK40A10J1
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| OCR Text |
...his product to decreas e in the reliability significantly even if the operating conditions (i.e. operat ing temperature/current/voltage, etc. ) are within the absolute maximum ratings. please design the appropriate reliability upon review... |
| Description |
40 A, 100 V, 0.017 ohm, N-CHANNEL, Si, POWER, MOSFET
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| File Size |
209.48K /
6 Page |
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it Online |
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TOSHIBA
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| Part No. |
TK12A53D
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| OCR Text |
...his product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. please design the appropriate reliability upon review... |
| Description |
Power MOSFET (N-ch 500V<VDSS≤700V)
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| File Size |
175.99K /
6 Page |
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it Online |
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Toshiba, Corp.
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| Part No. |
TJ15S10M3
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| OCR Text |
...this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. please design the appropriate reliability upon revi... |
| Description |
MOSFETs Silicon P-Channel MOS (U-MOS)
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| File Size |
233.39K /
9 Page |
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it Online |
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| Part No. |
TC59SM808CMBL-80
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| OCR Text |
...king to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibi lit... |
| Description |
32M X 8 SYNCHRONOUS DRAM, 6 ns, PBGA60
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| File Size |
2,246.80K /
50 Page |
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it Online |
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Vishay
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| Part No. |
SIA427DJ
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| OCR Text |
...ended periods may affect device reliability. specifications (t j = 25 c, unless otherwise noted) parameter symbol test conditions min. typ. max. unit static drain-source breakdown voltage v ds v gs = 0, i d = - 250 a - 8 v v ds tempe... |
| Description |
P-Channel 8 V (D-S) MOSFET
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| File Size |
207.32K /
9 Page |
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it Online |
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| Part No. |
RN2108FT
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| OCR Text |
...ing to improve the quality an d reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibili... |
| Description |
100 mA, 50 V, PNP, Si, SMALL SIGNAL TRANSISTOR
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| File Size |
206.63K /
6 Page |
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it Online |
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| Part No. |
NAR247
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| OCR Text |
... 19.0 mm 245/247 series page 11 reliability testing result failure criteria reliability testing result applicable standard testing conditions duration failure room temp. operating life eiaj ed- 4701/100(101) ta = 25 , i f = maxium rated c... |
| Description |
7 SEG NUMERIC DISPLAY, RED, 10.72 mm
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| File Size |
309.94K /
12 Page |
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it Online |
Download Datasheet |
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